XV Russian Symposium on Scanning Electron Microscopy
and Analytical Methods of Investigation of Solids (REM-2007)
(Institute of Microelectronics Technology and High Purity Materials,
Russian Academy of Sciences; Shubnikov Institute of Crystallography,
Russian Academy of Sciences; and Scientific Committee of Russian Academy of Sciences
on Electron Microscopy; Chernogolovka, Russia, 2007)

Structure of Ba_0.7Sr_0.3TiO₃ Films Grown by Chemical Solution Deposition on Polycor Substrates

O. M. Zhigalina, K. A. Vorotilov, D. N. Khmelenin, and A. S. Sigov p. 677 abstract

Atomic Force Microscopy of the Mirror Cleavage Surface of Defect TGS Crystals

N. V. Belugina, R. V. Gainutdinov, and A. L. Tolstikhina p. 683 abstract

EBIC Investigations of GaN Layers Prepared by Epitaxial Lateral Overgrowth

P. S. Vergeles, A. V. Govorkov, A. Ya. Polyakov, N. B. Smirnov, and E. B. Yakimov p. 688 abstract

Atomic Force Microscopy Study of Ferroelectric Films of P(VDFTrFE) Copolymer
and Composites Based on It

A. V. Solnyshkin, D. A. Kiselev, A. A. Bogomolov, A. L. Kholkin,
W. Künstler, and R. Gerhard p. 692 abstract

Study of High-Porous Silica Surface by Atomic Force Microscopy

S. N. Kokorin, E. A. Sosnov, and A. A. Malygin p. 696 abstract

Features of Sample Preparation and Atomic Force Microscopy Study of Dispersed Nanomaterials

E. A. Sosnov and A. A. Malygin p. 699 abstract

Epitaxial Growth of CeO₂ on Silicon and Distribution of Element Concentration at the Interface

V. G. Beshenkov, A. G. Znamenskii, and V. A. Marchenko p. 705 abstract

On the Choice of Initial Approximation in the Problem of Parameter Identification
of Direct-Gap Semiconductors by Cathodoluminescence Microscopy

Yu. E. Gagarin, N. N. Mikheev, A. N. Polyakov, and M. A. Stepovich p. 709 abstract

Structure, Properties, and Formation Models of Optical Ceramics

M. Sh. Akchurin, R. V. Gainutdinov, R. M. Zakalyukin, and A. A. Kaminskii p. 716 abstract

Features in Atomic Force Microscopy Studies of Dielectric Surfaces

A. L. Tolstikhina, R. V. Gainutdinov, M. L. Zanaveskin, K. L. Sorokina,
N. V. Belugina, and Yu. V. Grishchenko p. 722 abstract

Effect of Sample Contamination in SEMs on Linear Size Measurements

Yu. V. Larionov, V. B. Mityukhlyaev, and M. N. Filippov p. 727 abstract

Influence of a Lubricant Modified with Fine-Dispersed -Sialon on a Steel Surface Structure
under Friction Loading

E. N. Volnyanko, S. F. Ermakov, and V. A. Smurugov p. 738 abstract

Analysis of the Adhesion Strength of the Composite Coating Based
on a Sodium Carboxymethylcellulose Polymer Matrix
with a Fine-Dispersed Aluminum Filler

N. M. Antonova and V. I. Kulinich p. 744 abstract

Comparison of Autoemission Properties of Tungsten/n- and p-Type Semiconductor Systems

N. V. Egorov, L. I. Antonova, and S. P. Antonov p. 748 abstract

Effect of Partial Recovery of Zinc Surface at Room Temperature after Basal Plane Indentation

P. V. Kuznetsov, I. V. Petrakova, and N. P. Beketov p. 751 abstract

Mineral Nanoparticles in Dispersed Soils

V. N. Sokolov, M. S. Chernov, V. G. Shlykov^†, O. V. Razgulina,
D. I. Yurkovets, and V. V. Krupskaya p. 759 abstract

Quantum Size Effect during the Electron Exchange between a Negative Hydrogen Ion
and a Cluster of Aluminum Atoms

A. A. Magunov, D. K. Shestakov, I. K. Gainullin, and I. F. Urazgil’din p. 764 abstract

Theoretical Permittivity Spectra of Isoelectronic Ge, GaAs, ZnSe, and CuBr Crystals

A. I. Kalugin and V. V. Sobolev p. 768 abstract

Spectra of the Complete Set of CdBr₂ Optical Functions in a Broad Energy Range of 3 to 30 eV

E. V. Baranova, A. I. Kalugin, V. V. Sobolev, and V. Val. Sobolev p. 772 abstract

Fine Structure of the Diffraction Image of an Edge Dislocation
in High-Resolution Section Topography

E. V. Suvorov and I. A. Smirnova p. 777 abstract

Infrared Spectroscopic Characterization of the Properties of Oxide Films Grown
on Zr Surfaces Doped under Ion-Beam Irradiation in a VaporWater Medium

B. A. Kalin, N. V. Volkov, and I. V. Oleinikov p. 783 abstract

Plasmon Model for Excitation of Secondary Atoms
in Ion Sputtering (Comparison with Electron-Exchange Models)

N. N. Nikitenkov p. 787 abstract

Al/Nb Interface Study Based on the Analysis of the Energy Spectra of Reflected Electrons

V. P. Afanas’ev, A. V. Lubenchenko, and A. B. Pavolotskii p. 790 abstract

Grazing Incidence Off-Plane Lamellar Grating as a Beam Splitter for a 1-Å Free Electron Laser

L. I. Goray p. 796 abstract

Spectra of Characteristic Losses and the Electronic Structure of Sodium Nitrite

A. I. Kalugin, V. V. Sobolev, S. G. Iskhakova, and V. Val. Sobolev p. 801 abstract

Synchrotron Reflectivity Spectrum, Characteristic Electron Losses,
and Electronic Structure of TlCl Crystals

V. V. Sobolev, A. I. Kalugin, V. N. Kostenkov, and V. Val. Sobolev p. 806 abstract

Influence of Low-Energy Ion Treatment on the Roughness of Glassceramic,
Alumina, and Quartz Substrates

V. M. Vetoshkin and P. N. Krylov p. 811 abstract

Electrolytes in Etching of Latent Tracks of Heavy Ions in Polyethylene Terephthalate

A. I. Vilensky, Yu. K. Kochnev, S. V. Vlasov, and B. V. Mchedlishvili p. 814 abstract

Obituary

Svetlana Ivanovna Zheludeva (1948–2008) p. 817